1 | Light- emitting diode (LED) | 1 | photoelectric property Averaged LED Intensity | Measurement of LEDS CIE 127:2007 | Accredited only for:2mcd~50cd, Accredited only for:CIE Standard condition B:100mm |
2 | photoelectric property Total Luminous Flux | Accredited only for:10mlm-25klm |
3 | photoelectric propertyDominant Wavelength | Accredited only for:(380~1040)nm |
1 | Light- emitting diode (LED) | 4 | photoelectric property Chromaticity Coordinates | Measurement of LEDS CIE 127:2007 | |
5 | photoelectric property Peak wavelength | Accredited only for:(380~1040)nm |
6 | photoelectric property Color Temperature | |
7 | photoelectric property Forward voltage | Accredited only for:(0~200)v |
8 | photoelectric property Reverse current | Accredited only for:(0~1)A |
9 | photoelectric property Forward current | Accredited only for:(0~1)A |
10 | photoelectric property Color Rendering Index | Methods of measuring the color of light sources GB/T 5702–2003 | Accredited only for:Ri,Ra |
1 | Light- emitting diode (LED) | 11 | photoelectric property Junction Temperature | Implementation of the electrical test method for the measurement of real thermal resistance and impedance of light-emitting diodes with exposed cooling JESD51-51:2012 | |
12 | photoelectric property Thermal resistance | |
1 | Light- emitting diode (LED) | 13 | failure analysis External examination | Failure Analysis Procedures For Microcircuits MIL-STD-883J,METHOD 5003:2014 | |
14 | failure analysis Electrical verification procedures | |
15 | failure analysis Additional electrical tests | |
16 | failure analysis Internal examination | |
1 | Light- emitting diode (LED) | 17 | failure analysis Internal section | Failure Analysis Procedures For Microcircuits MIL-STD-883J,METHOD 5003:2014 | |
1 | Light- emitting diode (LED) | 18 | environmental reliability Cold test | Environmental testing for electric and electronic products-Part 2: Test Methods Test A:Cold GB/T 2423.1-2008 | Accredited only for:Volume:≦1 m³; Temperature:(-60~0)℃ |
19 | environmental reliability Dry heat test | Environmental testing for electric and electronic products-Part 2: Test Methods Test B: Dry heat GB/T 2423.2-2008 | Accredited only for:Volume:≦1m³;Temperature:(25~150)℃ |
20 | environmental reliability Damp heat, steady state test | Environmental testing for electric and electronic products-Part 2: Test Methods Test Cab: Damp heat, steady state GB/T 2423.3-2006 | Accredited only for:Volume:≦1 m³; Temperature:(20~90)℃;Humidity:(40~95)%RH |
1 | Light- emitting diode (LED) | 21 | environmental reliability Damp heat, cyclic test | Environmental testing for electric and electronic products-Part 2: Test Methods Test Db: Damp heat, cyclic(12h+12h cycle) GB/T 2423.4-2008 | Accredited only for:Volume:≦1 m³;Temperature:(20~90)℃;Humidity:(40~95)%RH |
22 | environmental reliability Change of temperature test | Environmental testing for electric and electronic products-Part 2: Test Methods Test N: Change of temperature GB/T 2423.22-2012 | Accredited only for:Volume:≦1 m³; Temperature:(-60~140)℃ |