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48344 2018-5-28 1745

序号	检测对象	项目/参数		检测标准（方法）名称及编号（含年号）	限制范围
序号	检测对象	序号	名称	检测标准（方法）名称及编号（含年号）	限制范围
1	电子电器产品环境有害物质	1	镉(Cd)	电工制品中特定物质的测定.第5部分:通过原子吸收分光光度法(AAS)、原子荧光光谱法(AFS)、电感耦合等离子体发射光谱(ICP-OES)和电感耦合等离子体质谱(ICP-MS)测定聚合物和电子中镉、铅和铬及金属中镉和铅IEC62321-5：2013	只用电感耦合等离子体发射光谱法(ICP-OES)
1	电子电器产品环境有害物质	1	镉(Cd)	塑料—镉的测定—湿式分解法 EN 1122：2001 硅质及有机质材的微波消解方法 US EPA 3052: 1996
		1	镉(Cd)	电感耦合等离子体原子发射谱法 US EPA 6010D: 2014
		2	铅(Pb)	电工制品中特定物质的测定.第5部分:通过原子吸收分光光度法(AAS)、原子荧光光谱法(AFS)、电感耦合等离子体发射光谱(ICP-OES)和电感耦合等离子体质谱(ICP-MS)测定聚合物和电子中镉、铅和铬及金属中镉和铅IEC62321-5：2013	只用电感耦合等离子体发射光谱法(ICP-OES)
				硅质及有机质材的微波消解方法 US EPA 3052: 1996
				电感耦合等离子体原子发射谱法 US EPA 6010D: 2014
		3	汞(Hg)	电工制品中特定物质的测定.第4部分:使用CV-AAS, CV-AFS, ICP- OES 和 ICP-MS測定聚合物、金屬和電子材料中的汞IEC62321-4：2013	只用电感耦合等离子体发射光谱法(ICP-OES)
1	电子电器产品环境有害物质	3	汞(Hg)	硅质及有机质材的微波消解方法 US EPA 3052: 1996
		3	汞(Hg)	电感耦合等离子体原子发射谱法 US EPA 6010D: 2014
		4	六价铬(Cr6+)	电子电气产品中限用的六种物质浓度的测定程序；IEC62321：2008
		4	六价铬(Cr6+)	六价铬测定的碱溶解方法 US EPA 3060A: 1996 比色法测定六价铬 US EPA 7196A：1992
		5	多溴联苯(PBBs)和多溴二苯醚(PBDEs)	部分:使用GC-MS测定聚合物和电子材料中多溴联苯和多溴联苯醚 IEC 62321-6-2015，
				微波萃取法 US EPA 3546: 2000 索氏提取法 US EPA Methods 3540C: 1996，
				气相色谱质谱联用仪测定半挥发性有机物成分； US EPA Methods 8270D: 2014

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№	Test Object	Item/Parameter		Title, Code of Standard or Method	Limitation
№	Test Object	№	Item/ Parameter	Title, Code of Standard or Method	Limitation
1	Electronic products harmful substances	1	Cd	Determination of certain substances in electrotechnical products - Part 5: Determination of cadmium, lead, and chromium in polymers and electronics and cadmium and lead in metals by AAS, AFS, ICP- OES and ICP-MS IEC62321-5：2013	Accredited only for ICP-OES
1	Electronic products harmful substances	1	Cd	Plastics-D eterminatiobn of Cadmium-Wet decomposition method; EN1122:2001 Microwave assisted acid digestion of siliceous and organically based matrices US EPA 3052:1996
		1	Cd	Inductivity coupled plasma-atomic emission spectrometry US EPA 6010D: 2014
		2	Pb	Determination of certain substances in electrotechnical products - Part 5: Determination of cadmium, lead, and chromium in polymers and electronics and cadmium and lead in metals by AAS, AFS, ICP- OES and ICP-MS IEC62321-5：2013	Accredited only for ICP-OES
1	Electronic products harmful substances	2	Pb	Microwave assisted acid digestion of siliceous and organically based matrices US EPA 3052:1996
		2	Pb	Inductivity coupled plasma-atomic emission spectrometry US EPA 6010D: 2014
		3	Hg	Determination of certain substances in electrotechnical products - Part 4: Determination of mercury in polymers, metals and electronics by CV-AAS, CV-AFS, ICP- OES and ICP-MS IEC62321-4：2013	Accredited only for ICP-OES
				Microwave assisted acid digestion of siliceous and organically based matrices US EPA 3052:1996
				Inductivity coupled plasma-atomic emission spectrometry US EPA 6010D: 2014
1	Electronic products harmful substances	4	Cr6+	Procedures for the determination of levels of six regulated substances (lead, cadmium, mercury, hexavalent chromium, polybrominated biphenyls, polybrominted biphenyl ether) in electro technical products IEC 62321:2008
		4	Cr6+	Alkaline digestion for hexavalent chromium US EPA 3060A: 1996 Chromium, hexavalent US EPA 7196A: 1992
		5	PBBs & PBDEs	Determination of certain substances in electrotechnical products - Part 6: Polybrominated biphenyls and polybrominated diphenyl ethers in polymers by gas chromatograhy -mass spectometry (GC-MS) IEC 62321-6-2015
1	Electronic products harmful substances	5	PBBs & PBDEs	Microwave extraction US EPA 3546: 2000 Soxhlet extraction US EPA Methods 3540C: 1996
1	Electronic products harmful substances	5	PBBs & PBDEs	Semi-volatile organic compounds by GC/MS US EPA 8270D：2014

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